Resumen
Transmission electron microscopy (TEM) provides information at atomic scale to study structural and chemical properties of novel materials such as metallic alloys, semiconductors, ceramics, etc. Understanding those materials’ behavior under external signals in now one of the most recent challenges in TEM. Physical measurements in situ TEM at individual nanostructures include mechanical (stress vs strain curves), electrical (I-V curves), phase transformations (cooling/heating), magnetization, and optical measurements.
New investigations in materials at nanoscale explored by in situ TEM will be presented. Particularly, the study of crystalline orientation maps using precession electron diffraction and off-axis electron holography will be covered to study magnetic properties in materials, including in situ magnetization of metallic nano-wires within the TEM column. In addition, new frontiers in crystalline analysis using fast electron diffraction, precession electron diffraction and electron dose-controlled for sensitive materials will be included in the seminar. Applications of the presented methods include the study of magnetic nano-structured materials and local magnetometry in TEM.